Title of article :
Structure of the oxidized 4H–SiC(0 0 0 1)-3 × 3 surface
Author/Authors :
Voegeli، نويسنده , , Wolfgang and Akimoto، نويسنده , , Koichi and Urata، نويسنده , , Tomoaki and Nakatani، نويسنده , , Shinichiro and Sumitani، نويسنده , , Kazushi and Takahashi، نويسنده , , Toshio and Hisada، نويسنده , , Yoshiyuki and Mitsuoka، نويسنده , , Yoshihito and Mukainakano، نويسنده , , Shinichi and Sugiyama، نويسنده , , Hiroshi and Zhang، نويسنده , , Xiao-Wei and Kawata، نويسنده , , Hiroshi، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2007
Pages :
6
From page :
1048
To page :
1053
Abstract :
We have determined the structure of the 4H–SiC(0 0 0 1)-3 × 3 surface after exposure to small amounts of molecular oxygen at room temperature using surface X-ray diffraction. The 3 × 3 reconstruction remains until at least an exposure of 10,000 L, but the diffracted intensities change, indicating structural changes. Comparison of the Patterson maps of the clean and oxidized surface shows that the main changes occur at the Si tetramer on top of the 3 × 3 surface. Atomic positions for several models were fitted to the experimental data. A model in which oxygen atoms are inserted into the Si tetramer gives the best fit to the experimental data. The best-fit atomic positions agree well with those obtained using density functional calculations.
Keywords :
silicon carbide , Oxidation , Adsorption , X-ray diffraction , surface structure , Density functional calculations
Journal title :
Surface Science
Serial Year :
2007
Journal title :
Surface Science
Record number :
1700321
Link To Document :
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