Title of article
Current–distance–voltage characteristics of electron tunneling through an electrochemical STM junction
Author/Authors
Woo، نويسنده , , D-H. and Choi، نويسنده , , E-M. and Yoon، نويسنده , , Y-H. and Kim، نويسنده , , K-J. and Jeon، نويسنده , , I.C. and Kang، نويسنده , , H.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2007
Pages
6
From page
1554
To page
1559
Abstract
We have studied the electron tunneling process through an electrochemical scanning tunneling microscopic (STM) junction formed by a gold tip and a gold electrode immersed in an inert NaClO4 solution. Current–distance–voltage characteristics of the tunneling process are examined by simultaneous measurement of tunneling current, voltage, and distance. The results indicate that the tunneling voltage across the junction changes with tunneling distance; however, tunneling conductance is an inverse exponential function of distance over the entire investigated range of tunneling current, voltage, and distance. The results provide clear evidence for the validity of a one-dimensional tunneling model for the aqueous tunneling process. Implications of the observation are mentioned with regard to the distance-dependent STM imaging and the origin of a low tunneling barrier height.
Keywords
Electrochemistry , Gold electrode , Electron tunneling , Tunneling barrier height , Scanning tunneling microscopy (STM)
Journal title
Surface Science
Serial Year
2007
Journal title
Surface Science
Record number
1700522
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