• Title of article

    Current–distance–voltage characteristics of electron tunneling through an electrochemical STM junction

  • Author/Authors

    Woo، نويسنده , , D-H. and Choi، نويسنده , , E-M. and Yoon، نويسنده , , Y-H. and Kim، نويسنده , , K-J. and Jeon، نويسنده , , I.C. and Kang، نويسنده , , H.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    1554
  • To page
    1559
  • Abstract
    We have studied the electron tunneling process through an electrochemical scanning tunneling microscopic (STM) junction formed by a gold tip and a gold electrode immersed in an inert NaClO4 solution. Current–distance–voltage characteristics of the tunneling process are examined by simultaneous measurement of tunneling current, voltage, and distance. The results indicate that the tunneling voltage across the junction changes with tunneling distance; however, tunneling conductance is an inverse exponential function of distance over the entire investigated range of tunneling current, voltage, and distance. The results provide clear evidence for the validity of a one-dimensional tunneling model for the aqueous tunneling process. Implications of the observation are mentioned with regard to the distance-dependent STM imaging and the origin of a low tunneling barrier height.
  • Keywords
    Electrochemistry , Gold electrode , Electron tunneling , Tunneling barrier height , Scanning tunneling microscopy (STM)
  • Journal title
    Surface Science
  • Serial Year
    2007
  • Journal title
    Surface Science
  • Record number

    1700522