Title of article :
Current–distance–voltage characteristics of electron tunneling through an electrochemical STM junction
Author/Authors :
Woo، نويسنده , , D-H. and Choi، نويسنده , , E-M. and Yoon، نويسنده , , Y-H. and Kim، نويسنده , , K-J. and Jeon، نويسنده , , I.C. and Kang، نويسنده , , H.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2007
Abstract :
We have studied the electron tunneling process through an electrochemical scanning tunneling microscopic (STM) junction formed by a gold tip and a gold electrode immersed in an inert NaClO4 solution. Current–distance–voltage characteristics of the tunneling process are examined by simultaneous measurement of tunneling current, voltage, and distance. The results indicate that the tunneling voltage across the junction changes with tunneling distance; however, tunneling conductance is an inverse exponential function of distance over the entire investigated range of tunneling current, voltage, and distance. The results provide clear evidence for the validity of a one-dimensional tunneling model for the aqueous tunneling process. Implications of the observation are mentioned with regard to the distance-dependent STM imaging and the origin of a low tunneling barrier height.
Keywords :
Electrochemistry , Gold electrode , Electron tunneling , Tunneling barrier height , Scanning tunneling microscopy (STM)
Journal title :
Surface Science
Journal title :
Surface Science