• Title of article

    The molecular orientation of DNA bases on H-passivated Si(1 1 1) surfaces investigated by means of near edge X-ray absorption fine structure spectroscopy

  • Author/Authors

    Seifert، نويسنده , , Stefan and Gavrila، نويسنده , , Gianina N. and Zahn، نويسنده , , Dietrich R.T. and Braun، نويسنده , , Walter، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    2291
  • To page
    2296
  • Abstract
    Layers of the DNA bases adenine, cytosine, and guanine were deposited onto hydrogen passivated Si(1 1 1) surfaces. The average tilt angles of these molecules with respect to the substrate surface were determined by the angular dependence of the Near Edge X-ray Absorption Fine Structure (NEXAFS) of the carbon K-edge. The interpretation of the NEXAFS spectra was assisted by a semi-empirical approach to the calculation of the π∗-transition region which employs density functional theory calculations and core level photoemission data.
  • Keywords
    DNA base , Cytosine , guanine , Molecular orientation , Near edge X-ray absorption fine structure spectroscopy , NEXAFS , Core level , photoemission spectroscopy , adenine
  • Journal title
    Surface Science
  • Serial Year
    2007
  • Journal title
    Surface Science
  • Record number

    1700793