• Title of article

    Buildup of the InSe/M interface (M  Pd, Au) studied by X-ray photoemission and X-ray absorption spectroscopy

  • Author/Authors

    Sلnchez-Royo، نويسنده , , J.F. and Pellicer-Porres، نويسنده , , J. and Segura، نويسنده , , Joyce A. M. Gilliland، نويسنده , , S.J. and Safonova، نويسنده , , O. and Chevy، نويسنده , , A.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    3778
  • To page
    3783
  • Abstract
    The electronic properties of InSe/M (M Pd, Au) interfaces have been studied by X-ray photoemission measurements. For the InSe/Pd interface, it has been found that Pd atoms diffuse into the InSe lattice at early stages of Pd coverage, acting as acceptor centers. As the Pd coverage increases, a Pd–InSe reaction determines the electronic behaviour of the interface. However, for Pd coverages higher than 1 ML, the barrier formation tends to be controlled by an emerging bulklike Pd overlayer. Despite the atomic structure of this system is far from that expected for an ideal Schottky one, the final electronic barrier value is close to that expected for an abrupt InSe/Pd Schottky interface. On the contrary, the InSe/Au system appeared to behave as a quasi-ideal abrupt Schottky interface. Annealing processes performed at temperatures higher than 600 K alter this scheme, as revealed by X-ray absorption spectroscopy measurements, enhancing diffusion of Au atoms into InSe. In any case, the electronic barrier results to be determined by the Au overlayer formed.
  • Keywords
    Schottky interfaces , Layered compounds , X-ray photoemission , Reactivity , Metal-semiconductor interfaces
  • Journal title
    Surface Science
  • Serial Year
    2007
  • Journal title
    Surface Science
  • Record number

    1701345