Author/Authors :
Kotsugi، نويسنده , , Masato and Wakita، نويسنده , , Takanori and Kawamura، نويسنده , , Naomi and Taniuchi، نويسنده , , Toshiyuki and Ono، نويسنده , , Kanta and Suzuki، نويسنده , , Motohiro and Oshima، نويسنده , , Masaharu and Ishimatsu، نويسنده , , Naoki and Taniguchi، نويسنده , , Masaki and Maruyama، نويسنده , , Hiroshi، نويسنده ,
Abstract :
We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.
Keywords :
Iron meteorite , Chromite (Cr2FeO4) , XAFS , Photoelectron emission microscope (PEEM) , EXAFS
