Title of article
Application of photoelectron emission microscopy (PEEM) to extraterrestrial materials
Author/Authors
Kotsugi، نويسنده , , Masato and Wakita، نويسنده , , Takanori and Kawamura، نويسنده , , Naomi and Taniuchi، نويسنده , , Toshiyuki and Ono، نويسنده , , Kanta and Suzuki، نويسنده , , Motohiro and Oshima، نويسنده , , Masaharu and Ishimatsu، نويسنده , , Naoki and Taniguchi، نويسنده , , Masaki and Maruyama، نويسنده , , Hiroshi، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2007
Pages
4
From page
4764
To page
4767
Abstract
We observed the spatially resolved X-ray absorption fine structure of meteoritic inclusion by photoelectron emission microscopy in conjunction with hard-X-ray synchrotron radiation. The cracked domain in the inclusion is identified as Cr2FeO4 (chromite), and its electronic structure shows identical behavior with that of synthetic chromite. The photon energy is also scanned over the extended region to obtain the radial distribution function. It finally shows almost identical behavior as synthetic chromite.
Keywords
Iron meteorite , Chromite (Cr2FeO4) , XAFS , Photoelectron emission microscope (PEEM) , EXAFS
Journal title
Surface Science
Serial Year
2007
Journal title
Surface Science
Record number
1702093
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