Author/Authors :
Saito، نويسنده , , A. and Takahashi، نويسنده , , K. and Takagi، نويسنده , , Y. and Nakamatsu، نويسنده , , K. and Hanai، نويسنده , , K. and Tanaka، نويسنده , , Y. and Miwa، نويسنده , , D. and Akai-kasaya، نويسنده , , M. and Shin، نويسنده , , S. and Matsui، نويسنده , , S. and Ishikawa، نويسنده , , T. and Kuwahara، نويسنده , , Y. and Aono، نويسنده , , M.، نويسنده ,
Abstract :
To solve difficulties of instability and inaccuracy in synchrotron radiation based scanning tunneling microscopy, a method to reduce noise was investigated. New insulator-coat tips were developed to shut out electrons coming from a wide area that damage the spatial resolution. By changing the exposed conductive area at the end of the insulator-coat tips, the effect of noise reduction was estimated. The tip with an exposure area of 50 nm in diameter was found to reduce noise effectively. Also a key discriminating condition was found to obtain the local signal, which is based on the modulation of the X-ray-induced tip current caused by excitation of the specific element.
Keywords :
elemental analysis , 1 , 1) , Ge island , noise reduction , Synchrotron radiation , TIP , Scanning tunneling microscopy , Si(1 , Insulator
