• Title of article

    Adsorption geometry of furan on Si(1 0 0)-2 × 1

  • Author/Authors

    Lee، نويسنده , , Han-Koo and Kim، نويسنده , , Ki-jeong and Kang، نويسنده , , Tai-Hee and Chung، نويسنده , , J.W. and Kim، نويسنده , , Bongsoo، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2008
  • Pages
    5
  • From page
    914
  • To page
    918
  • Abstract
    We have investigated adsorption of furan on Si(1 0 0) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray absorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, O 1s spectra of furan on Si(1 0 0) show that furan is chemisorbed on Si(1 0 0)-2 × 1 through [4 + 2] cycloaddition. NEXAFS has been conducted to characterize the adsorption geometry of furan on Si(1 0 0). Since the π∗ orbital of CC bond showed a good angle dependence in carbon K-edge NEXAFS spectra, the angle 28 ± 2° determined from NEXAFS spectra appears to deviate from a theoretical value of 19° for the [4 + 2] cycloaddition by 9°, mostly due to the intrinsic defects on the Si(1 0 0)-2 × 1 substrate surface.
  • Keywords
    furan , 0  , 0) , Adsorption , PES , NEXAFS , Molecular orientation , Organic-semiconductor interface , Si(1 
  • Journal title
    Surface Science
  • Serial Year
    2008
  • Journal title
    Surface Science
  • Record number

    1702900