Title of article :
Core-level spectroscopy of the Ni/W(1 1 0) interface: Correlation of W interfacial core-level shifts with first-layer Ni phases
Author/Authors :
Daniel Riffe، نويسنده , , D.M. and Franckowiak، نويسنده , , R.T. and Shinn، نويسنده , , N.D. and Kim، نويسنده , , B. and Kim، نويسنده , , K.J. and Kang، نويسنده , , T.-H.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2008
Pages :
8
From page :
2039
To page :
2046
Abstract :
We have measured W 4f7/2 core-level photoemission spectra from W(1 1 0) in the presence of Ni overlayers, from ∼0.2 to ∼3 monolayers. Interfacial core-level shifts associated with first-layer Ni phases have been identified: −230 ± 15 meV for the 1 × 1 pseudomorphic phase and −70 ± 7 meV for the 7 × 1 close-packed commensurate phase. At higher Ni coverages the interfacial core-level shift is −100 ± 10 meV. These shifts are analyzed using the partial-shift model of Nilsson et al. [Phys. Rev. B 38 (1988) 10357]; the analysis indicates that the difference in binding energies between the 1 × 1 and 7 × 1 phases has a large contribution from structural differences between the two phases.
Keywords :
Soft X-ray photoelectron spectroscopy , Tungsten , Surface electronic structure , Bimetallic surfaces , nickel
Journal title :
Surface Science
Serial Year :
2008
Journal title :
Surface Science
Record number :
1703336
Link To Document :
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