Title of article
Electrochemical Au deposition on stepped Si(1 1 1)-H surfaces: 3D versus 2D growth studied by AFM and X-ray diffraction
Author/Authors
Warren، نويسنده , , S. and Prod’homme، نويسنده , , P. and Maroun، نويسنده , , F. and Allongue، نويسنده , , P. and Cortès، نويسنده , , R. and Ferrero، نويسنده , , C. and Lee، نويسنده , , T.-L. and Cowie، نويسنده , , B.C.C. and Walker، نويسنده , , C.J. and Ferrer، نويسنده , , S. and Zegenhagen، نويسنده , , J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2009
Pages
9
From page
1212
To page
1220
Abstract
In order to grow magnetic layers on silicon substrates, a non-magnetic buffer layer is often needed to avoid silicide formation and to reproduce the perpendicular magnetic anisotropy obtained on metal single crystals, as in the case of Co on Au(1 1 1) and Pt(1 1 1). In this context, we have studied the electrochemical growth of Au buffer layers, and show that it is possible to obtain different film morphologies on hydrogen-terminated vicinal Si(1 1 1) surfaces by varying the electrochemical deposition parameters and solution composition. Two different morphologies have been obtained as observed by atomic force microscopy: continuous 2D Au films (chloride solution at pH 4), and films consisting in flat top 3D Au islands decorating the Si(1 1 1) step edges (cyanide solution at pH 14). X-ray diffraction measurements reveal that the gold layer and islands have Au(1 1 1) orientation and are in epitaxy with the Si(1 1 1) surface. In the case of islands, the lateral facets have also Au(1 1 1) orientation. Results are discussed within a model in which the breaking of the Si–H surface bonds plays a major role in the Au nucleation and growth mechanisms.
Keywords
electrochemical deposition , X-ray diffraction , AFM , Gold , Silicon
Journal title
Surface Science
Serial Year
2009
Journal title
Surface Science
Record number
1704616
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