• Title of article

    Electrochemical Au deposition on stepped Si(1 1 1)-H surfaces: 3D versus 2D growth studied by AFM and X-ray diffraction

  • Author/Authors

    Warren، نويسنده , , S. and Prod’homme، نويسنده , , P. and Maroun، نويسنده , , F. and Allongue، نويسنده , , P. and Cortès، نويسنده , , R. and Ferrero، نويسنده , , C. and Lee، نويسنده , , T.-L. and Cowie، نويسنده , , B.C.C. and Walker، نويسنده , , C.J. and Ferrer، نويسنده , , S. and Zegenhagen، نويسنده , , J.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2009
  • Pages
    9
  • From page
    1212
  • To page
    1220
  • Abstract
    In order to grow magnetic layers on silicon substrates, a non-magnetic buffer layer is often needed to avoid silicide formation and to reproduce the perpendicular magnetic anisotropy obtained on metal single crystals, as in the case of Co on Au(1 1 1) and Pt(1 1 1). In this context, we have studied the electrochemical growth of Au buffer layers, and show that it is possible to obtain different film morphologies on hydrogen-terminated vicinal Si(1 1 1) surfaces by varying the electrochemical deposition parameters and solution composition. Two different morphologies have been obtained as observed by atomic force microscopy: continuous 2D Au films (chloride solution at pH 4), and films consisting in flat top 3D Au islands decorating the Si(1 1 1) step edges (cyanide solution at pH 14). X-ray diffraction measurements reveal that the gold layer and islands have Au(1 1 1) orientation and are in epitaxy with the Si(1 1 1) surface. In the case of islands, the lateral facets have also Au(1 1 1) orientation. Results are discussed within a model in which the breaking of the Si–H surface bonds plays a major role in the Au nucleation and growth mechanisms.
  • Keywords
    electrochemical deposition , X-ray diffraction , AFM , Gold , Silicon
  • Journal title
    Surface Science
  • Serial Year
    2009
  • Journal title
    Surface Science
  • Record number

    1704616