Author/Authors :
Xu، نويسنده , , P. K. Ackerman، نويسنده , , M.L. and Barber، نويسنده , , S.D. and Schoelz، نويسنده , , J.K. and Thibado، نويسنده , , P.M. and Wheeler، نويسنده , , V.D. and Nyakiti، نويسنده , , L.O. and Myers-Ward، نويسنده , , R.L. and Eddy، نويسنده , , Jr.، نويسنده , , C.R. and Gaskill، نويسنده , , D.K.، نويسنده ,
Abstract :
Scanning tunneling microscopy (STM) images are obtained for the first time on few layer and twisted multilayer epitaxial graphene states synthesized on n+ 6H-SiC a-plane non-polar surface. The twisted graphene is determined to have a rotation angle of 5.4° between the top two layers, by comparing moiré patterns from stick and ball models of bilayer graphene to experimentally obtained images. Furthermore, the experimental moiré pattern shows dynamic behavior, continuously shuffling between two stable surface arrangements one bond length apart. The moiré pattern shifts by more than 1 nm, making it easy to observe with STM. Explanation of this dynamic behavior is attributed to electrostatic interactions between the STM tip and the graphene sample.
Keywords :
Twisted graphene , Scanning tunneling microscopy , silicon carbide , Moiré pattern