Title of article
Competing scanning tunneling microscope tip-interlayer interactions for twisted multilayer graphene on the a-plane SiC surface
Author/Authors
Xu، نويسنده , , P. K. Ackerman، نويسنده , , M.L. and Barber، نويسنده , , S.D. and Schoelz، نويسنده , , J.K. and Thibado، نويسنده , , P.M. and Wheeler، نويسنده , , V.D. and Nyakiti، نويسنده , , L.O. and Myers-Ward، نويسنده , , R.L. and Eddy، نويسنده , , Jr.، نويسنده , , C.R. and Gaskill، نويسنده , , D.K.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2013
Pages
5
From page
113
To page
117
Abstract
Scanning tunneling microscopy (STM) images are obtained for the first time on few layer and twisted multilayer epitaxial graphene states synthesized on n+ 6H-SiC a-plane non-polar surface. The twisted graphene is determined to have a rotation angle of 5.4° between the top two layers, by comparing moiré patterns from stick and ball models of bilayer graphene to experimentally obtained images. Furthermore, the experimental moiré pattern shows dynamic behavior, continuously shuffling between two stable surface arrangements one bond length apart. The moiré pattern shifts by more than 1 nm, making it easy to observe with STM. Explanation of this dynamic behavior is attributed to electrostatic interactions between the STM tip and the graphene sample.
Keywords
Twisted graphene , Scanning tunneling microscopy , silicon carbide , Moiré pattern
Journal title
Surface Science
Serial Year
2013
Journal title
Surface Science
Record number
1706097
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