Title of article :
Competing scanning tunneling microscope tip-interlayer interactions for twisted multilayer graphene on the a-plane SiC surface
Author/Authors :
Xu، نويسنده , , P. K. Ackerman، نويسنده , , M.L. and Barber، نويسنده , , S.D. and Schoelz، نويسنده , , J.K. and Thibado، نويسنده , , P.M. and Wheeler، نويسنده , , V.D. and Nyakiti، نويسنده , , L.O. and Myers-Ward، نويسنده , , R.L. and Eddy، نويسنده , , Jr.، نويسنده , , C.R. and Gaskill، نويسنده , , D.K.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2013
Pages :
5
From page :
113
To page :
117
Abstract :
Scanning tunneling microscopy (STM) images are obtained for the first time on few layer and twisted multilayer epitaxial graphene states synthesized on n+ 6H-SiC a-plane non-polar surface. The twisted graphene is determined to have a rotation angle of 5.4° between the top two layers, by comparing moiré patterns from stick and ball models of bilayer graphene to experimentally obtained images. Furthermore, the experimental moiré pattern shows dynamic behavior, continuously shuffling between two stable surface arrangements one bond length apart. The moiré pattern shifts by more than 1 nm, making it easy to observe with STM. Explanation of this dynamic behavior is attributed to electrostatic interactions between the STM tip and the graphene sample.
Keywords :
Twisted graphene , Scanning tunneling microscopy , silicon carbide , Moiré pattern
Journal title :
Surface Science
Serial Year :
2013
Journal title :
Surface Science
Record number :
1706097
Link To Document :
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