Title of article
Microstructures and oxygen diffusion at the LaMnO3 film/yttria-stabilized zirconia interface
Author/Authors
Horita، نويسنده , , Teruhisa and Tsunoda، نويسنده , , Tatsuro and Yamaji، نويسنده , , Katsuhiko and Sakai، نويسنده , , Natsuko and Kato، نويسنده , , Tohru and Yokokawa، نويسنده , , Harumi، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2002
Pages
8
From page
439
To page
446
Abstract
Microstructures and oxygen diffusion were investigated at the LaMnO3 film/Y2O3-stabilized ZrO2 (YSZ) interface by transmission electron microscopy (TEM), atomic force microscopy (AFM) and secondary ion mass spectrometry (SIMS) analysis for samples after heat treatments and isotope oxygen exchange (16O/18O exchange) experiments. In “as-deposited LaMnO3 film” on YSZ, the 18O-diffusion profile showed a significant decrease in 18O concentration near the LaMnO3 film/YSZ interface, which corresponds to an amorphous layer. The heat treatment diminished the amorphous layer at the LaMnO3 film/YSZ interface. In the heat-treated sample (1473 K for 5 h), the 18O-diffusion profile in the LaMnO3 film showed gradual decrease and a subsequent minimum of the 18O concentration at the LaMnO3/YSZ interface. This is due to the grain growth of lanthanum manganite, which provides the shorter paths to YSZ.
Keywords
YSZ , microstructure , Interface , SOFCs , oxygen diffusion , SIMS , LaMnO3 film
Journal title
Solid State Ionics
Serial Year
2002
Journal title
Solid State Ionics
Record number
1708843
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