Title of article :
Stabilization of the delta-phase in Bi2O3 thin films
Author/Authors :
Gomez، نويسنده , , Celia L. and Depablos-Rivera، نويسنده , , Osmary and Medina، نويسنده , , Juan C. and Silva-Bermudez، نويسنده , , Phaedra and Muhl، نويسنده , , Stephen and Zeinert، نويسنده , , Andreas and Rodil، نويسنده , , Sandra E.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2014
Pages :
6
From page :
147
To page :
152
Abstract :
In this paper, we report the stabilization of the δ-phase of Bi2O3 thin films from room temperature (RT) to 500 °C by the addition of tantalum ions. The δ-Bi2O3 phase is the material presenting the highest ionic conductivity; as bulk it is stable in a reduced temperature range from 730 to 825 °C, while the α-phase is the RT stable phase. However, when produced by atomic aggregation methods as a nanometric thin film, the delta-phase can be maintained at atmospheric conditions and it actually reverts to the alpha-phase only after thermal annealing, such transformation usually occurs around 250–350 °Cby passing through the β-phase. In this work, we report that tantalum addition during the deposition of the Bi2O3 films by magnetron sputtering allows the maintenance of the delta phase up to 500 °C upon thermal annealing in air.
Keywords :
Bismuth oxide , Thin films , thermal stability , sputtering
Journal title :
Solid State Ionics
Serial Year :
2014
Journal title :
Solid State Ionics
Record number :
1712631
Link To Document :
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