Title of article
Visualization of oxide ionic diffusion at SOFC cathode/electrolyte interfaces by isotope labeling techniques
Author/Authors
Horita، نويسنده , , Teruhisa and Nishi، نويسنده , , Mina and Shimonosono، نويسنده , , Taro and Kishimoto، نويسنده , , Haruo and Yamaji، نويسنده , , Katsuhiko and Brito، نويسنده , , Manuel E. and Yokokawa، نويسنده , , Harumi، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2014
Pages
5
From page
398
To page
402
Abstract
The depth profiles of secondary ion mass spectrometry (SIMS) have been applied to analyze the distribution of 18O and metal oxide ions precisely at La0.6Sr0.4Co0.2Fe0.8O3 − d/Gd0.1Ce0.9O2 − x (GDC)/Y0.15Zr0.85O2 − y (YSZ) interfaces. 18O concentration peak was identified only under cathodic polarization with a constant current density of 0.071 A cm− 2 at 973 K under 18O2 atmosphere. The 18O peak position was corresponded to the Sr condensed zone where SrZrO3 was formed at the GDC/YSZ interfaces. The SrZrO3 formation and the 18O concentration profile pile-up are correlated to each other.
Keywords
SOFC , isotope labeling , cathode , Depth profiles , SIMS
Journal title
Solid State Ionics
Serial Year
2014
Journal title
Solid State Ionics
Record number
1712808
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