Degradation of a solid state electrochromic device

A full monolithic inorganic electrochromic device was deposited by means of plasma assisted physical vapor deposition. The layer stack was evaporated under different conditions that optimized the performance of each individual layer. Optical and electrochemical characterizations were carried out on the EC-device in order to establish its performance. Electro-optical data were registered over more than 6000 cycles of mixed chronoamperometric and voltammetric cycles. Degradation of the electro-optical characteristics of the device was observed during the test, probably due to atmospheric interaction.