• Title of article

    Al-26 diffusion measurement in 2/1-mullite by means of Secondary Ion Mass Spectrometry

  • Author/Authors

    Fielitz، نويسنده , , P. H. Borchardt and N. V. Richardson، نويسنده , , G. and Schmücker، نويسنده , , M. and Schneider، نويسنده , , H.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2006
  • Pages
    4
  • From page
    493
  • To page
    496
  • Abstract
    Aluminium is an important constituent of advanced structural and functional ceramics, as well as of geological materials in the upper mantle. Aluminium has only one single stable isotope and radioisotopes which are difficult to apply routinely in radiotracer diffusion experiments. Therefore, it is a methodological challenge to measure aluminium diffusivities. Our novel approach consists in using the long-life radioactive isotope 26Al as a pseudo-stable isotope whose depth distribution can be analysed with Secondary Ion Mass Spectrometry after a diffusion experiment. For our demonstration we chose mullite (Al4+2xSi2−2xO10−x, 0.2< x < 0.5) which is an important candidate for advanced structural and functional ceramics with some outstanding properties: low thermal expansion, low thermal conductivity, and excellent creep resistance. The method is universally applicable to the huge family of aluminium containing oxides.
  • Keywords
    Aluminium diffusion , SIMS , Mullite , Al-26 tracer isotope
  • Journal title
    Solid State Ionics
  • Serial Year
    2006
  • Journal title
    Solid State Ionics
  • Record number

    1718663