Electrical conductivity of scandia-stabilized zirconia thin film

Scandia-stabilized zirconia (SSZ) thin films, ~ 400 nm thick, were deposited on sapphire substrate by a pulsed-laser deposition (PLD) method. Their structural and transport properties were studied by means of X-ray diffraction and electrical conductivity measurements. The in-plane conductivities of thin films were measured and compared to that of the bulk sample. Although the decrease in ionic conductivity near phase transition temperature (550 °C) was still shown in the case of the 10SSZ film, the conductivity drop was much smaller and less abrupt compared to that of bulk samples. With 1 mol% Y2O3 or CeO2 doping, the conductivity curves became linear. However, the conductivity was reduced from that of the undoped 10SSZ film.