Model for evolution of periodic layered structure in the SiO2/Mg system

A mathematical model for the growth of MgO/Mg2Si periodic layered structure (PLS) is presented based on Fickʹs diffusion law and conservation of matter. The model explains the temporal evolution of the width of periodic layers at different temperatures, for layers distant enough from the Mg source. It is demonstrated that the difference in thickness of a pair of any two adjacent layers decreases with increasing temperature.