Theoretical time series analysis from electric field oscillations generated by rate equations of generation–recombination processes in n-type semiconductors

We have analyzed the nonlinear electric field time series theoretically generated by a set of three coupled first-order differential equations in order to interpret the chaotic behavior present in measurements of low-frequency current oscillations in semiconductor samples. In the present work, we carry out a direct investigation of the theoretical time series applying techniques of experimental nonlinear time series analysis. We have reconstructed the phase space of the system and calculated some parameters as the correlation dimension of the reconstructed attractors, the Lyapunov exponentʹs spectrum and the Kaplan–Yorke dimension. The conclusions are consistent with the theory of chaotic systems and with the available experimental results for semiconductors.