Title of article
Low temperature electrical transport in La1−xNdxNiO3−δ
Author/Authors
Tiwari، نويسنده , , Ashutosh and Rajeev، نويسنده , , K.P. and Narayan، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
357
To page
361
Abstract
We have investigated low temperature electrical transport in La1−xNdxNiO3−δ perovskite oxide samples. Samples were prepared by a sol–gel method and were characterized by X-ray diffraction and chemical methods. High precision electrical resistivity, magnetoresistance (MR) and electron tunneling conductance measurements were performed. Crystal structure investigations showed a phase transition from rhombohedral to orthorhombic phase at x=0.4. In the orthorhombic phase Ni–O–Ni bond angle was found to depend very sensitively on the value of x; as the value of x increases Ni–O–Ni bond angle decreases resulting in the tilting of NiO6 octahedra. A Correlation between the Ni–O–Ni bond angle and electrical transport has been observed. The analysis of the electrical resistivity data showed the presence of disorder driven quantum correction effects, namely e–e interactions and weak localization, in the system. A dip in the tunneling density of states and negative MR also suggest the presence of e–e interaction and weak localization effects in the system.
Keywords
D. Electronic transport , A. Disordered perovskite , D. Tunneling , D. Electron–electron interaction , D. Phase transition
Journal title
Solid State Communications
Serial Year
2002
Journal title
Solid State Communications
Record number
1761901
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