Positron trapping in plastically deformed Cd

Positron measurements, both lifetime and annihilation lineshape, have been performed in Cd, plastically deformed at room temperature by 40 and 60% thickness reductions. Less change in lineshape parameter for 60% deformation is observed. The annealing of 40% deformed sample between 25 and 200 °C indicates the breaking up of dislocation network during recrystallisation process.