Electron spectroscopy of chemically synthesized ZnS clusters

Thin films of ionic compounds of ZnS clusters were measured by electron energy loss spectroscopy (EELS) and ultraviolet photoelectron spectroscopy (UPS). A size effect was observed in the valence plasmon energy measured by EELS from which the coherence length of the plasmon excitation can be estimated. The difference between the lowest excitations observed in UPS and EELS can be explained by the final state charging effect of a single cluster ion in UPS, which strongly depends upon the nominal charges of the clusters.