Title of article
Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides
Author/Authors
Mitterbauer، نويسنده , , C. and Hebert، نويسنده , , C. and Kothleitner، نويسنده , , G. and Hofer، نويسنده , , F. and Schattschneider، نويسنده , , P. and Zandbergen، نويسنده , , H.W.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
209
To page
213
Abstract
Electron energy-loss near-edge structure data for the N K and the Cr L2,3 edges of CrN and Cr2N have been acquired in order to distinguish between these chromium nitride modifications. The N K edge spectra of these compounds have been modelled using both band structure and multiple scattering methods. We compare the results of these calculations with the experimental edges which have been recorded using a conventional transmission electron microscope (TEM) as well as a monochromated TEM (Wien filter).
Keywords
C. Scanning and transmission electron microscopy , E. Electron energy loss spectroscopy , A. Chromium nitride
Journal title
Solid State Communications
Serial Year
2004
Journal title
Solid State Communications
Record number
1762959
Link To Document