Title of article
Transport in suspended graphene
Author/Authors
Adam، نويسنده , , S. and Das Sarma، نويسنده , , S.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
356
To page
360
Abstract
Motivated by recent experiments on suspended graphene showing carrier mobilities as high as 200,000 cm2/V s, we theoretically calculate transport properties assuming Coulomb impurities as the dominant scattering mechanism. We argue that the substrate-free experiments done in the diffusive regime are consistent with our theory and verify many of our earlier predictions including (i) removal of the substrate will increase mobility since most of the charged impurities are in the substrate, (ii) the minimum conductivity is not universal, but depends on impurity concentration with cleaner samples having a higher minimum conductivity. We further argue that experiments on suspended graphene put strong constraints on the two parameters involved in our theory, namely, the charged impurity concentration n imp and d , the typical distance of a charged impurity from the graphene sheet. The recent experiments on suspended graphene indicate a residual impurity density of 1 − 2 × 10 10 cm − 2 which are presumably stuck to the graphene interface, compared to impurity densities of ∼ 10 12 cm − 2 for graphene on SiO 2 substrate. Transport experiments can therefore be used as a spectroscopic tool to identify the properties of the remaining impurities in suspended graphene.
Keywords
D. Electronic transport , A. Graphene
Journal title
Solid State Communications
Serial Year
2008
Journal title
Solid State Communications
Record number
1764252
Link To Document