Title of article :
Nanolithography and manipulation of graphene using an atomic force microscope
Author/Authors :
Giesbers، نويسنده , , A.J.M. and Zeitler، نويسنده , , U. and Neubeck، نويسنده , , S. and Freitag، نويسنده , , F. and Novoselov، نويسنده , , K.S. and Maan، نويسنده , , J.C.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
4
From page :
366
To page :
369
Abstract :
We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possibility of tabletop graphene based device fabrication. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation we also show the influence of mechanical peeling and scratching with an AFM of few layer graphene sheets placed on different substrates.
Keywords :
A. Graphene , E. Nanolithography , E. Atomic force microscopy
Journal title :
Solid State Communications
Serial Year :
2008
Journal title :
Solid State Communications
Record number :
1764405
Link To Document :
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