Title of article :
Effect of temperature on Raman scattering in hexagonal ZnMgO for optoelectronic applications
Author/Authors :
Kong، نويسنده , , J.F. and Shen، نويسنده , , W.Z. and Zhang، نويسنده , , Y.W. and Li، نويسنده , , X.M. and Guo، نويسنده , , Q.X.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
10
To page :
13
Abstract :
We have carried out a detailed investigation of temperature-dependent micro-Raman scattering on hexagonal ZnMgO films with different Mg compositions (0–0.323). The phonon frequencies downshift and linewidths broadening of A 1 [longitudinal optical (LO)] and E 1 (LO) modes can be well explained by a model involving the contributions of thermal expansion, lattice-mismatch-induced strain, and anharmonic phonon processes. We have elucidated the variation with Mg composition of the contribution of the three- and four-phonon processes in the anharmonic effect. The present work establishes an experimental base for the micro-Raman technique to monitor the local temperature during the ZnMgO-based device operation with a submicrometer spatial resolution.
Keywords :
A. Thin films , C. Impurities in semiconductors , D. phonons , D. Anharmonicity
Journal title :
Solid State Communications
Serial Year :
2009
Journal title :
Solid State Communications
Record number :
1764727
Link To Document :
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