• Title of article

    Investigation of the crossover properties for the interaction parameters of a ferroelectric thin film

  • Author/Authors

    Lu، نويسنده , , Z.X. and Teng، نويسنده , , B.H. and Lu، نويسنده , , X.H. and Zhang، نويسنده , , X.J. and Wang، نويسنده , , C.D.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    4
  • From page
    1176
  • To page
    1179
  • Abstract
    The crossover feature, from the ferroelectric-dominant phase diagram (FPD) to the paraelectric-dominant phase diagram (PPD), for the interaction parameters of a ferroelectric thin film described by the transverse Ising model have been calculated in detail by the use of the mean-field approximation. The crossover values of the exchange interactions and the transverse fields for a thin film with certain layers are displayed as a curved surface in the three-dimensional parameter space. The numerical results show that for thin films with different numbers of layers there exists a common intersection line for the curved surfaces of the crossover values. Meanwhile the layer-independent equation for the intersection line is obtained for the first time.
  • Keywords
    A. Ferroelectrics , D. Phase diagram
  • Journal title
    Solid State Communications
  • Serial Year
    2009
  • Journal title
    Solid State Communications
  • Record number

    1765383