Title of article
Electronic structure of Mn in (Zn, Mn)O probed by resonant X-ray emission spectroscopy
Author/Authors
Jin، نويسنده , , J. and Chang، نويسنده , , G.S and Xu، نويسنده , , W. and Zhou، نويسنده , , Y.X. and Boukhvalov، نويسنده , , D.W. and Finkelstein، نويسنده , , L.D. and Kurmaev، نويسنده , , E.Z. and Zhang، نويسنده , , X.Y. and Moewes، نويسنده , , A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
4
From page
1065
To page
1068
Abstract
The electronic structure of Mn in (Zn, Mn)O with different Mn concentrations has been investigated using resonant X-ray emission spectroscopy (RXES). The Mn L 2 , 3 RXES spectra reveal different spectral features depending on the resonant excitation energies and Mn concentrations. The surface dd excitations at about −1.9 eV of energy loss are identified in the highest Mn-doped sample. The comparison of integral intensity ratio of Mn L 2 to L 3 emission lines for these samples suggests that ferromagnetic samples have a large amount of free charge carriers, which are under consideration for the origin of ferromagnetism, with respect to antiferromagnetic ones.
Keywords
E. Resonant X-ray emission spectroscopy , Mn)O , A. (Zn , D. Free charge carriers
Journal title
Solid State Communications
Serial Year
2010
Journal title
Solid State Communications
Record number
1766813
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