Title of article
A convenient method to determine the bulk modulus of nanowires and its temperature dependence based on X-ray diffraction measurement
Author/Authors
Li، نويسنده , , Xin Feng and Fei، نويسنده , , Guang Tao and Zhou، نويسنده , , Wen Fei and Zhang، نويسنده , , Li De، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
3
From page
1117
To page
1119
Abstract
The bulk modulus of nanowires (NWs) and its temperature dependence were determined by a simple and convenient method based on temperature-dependent X-ray diffraction (XRD) measurement. It was found that the bulk moduli for Ni, Cu, and Ag NWs were much higher than that for their counterpart bulk materials in the temperature range from 25 °C to 800 °C and the influence of temperature on the bulk modulus for NWs was stronger than that for their counterpart bulk materials. A surface bond contraction model and the force–interatomic-distance curves were introduced to explain the experimental results.
Keywords
A. Nanowire , D. Bulk modulus , D. Coefficient of thermal expansion
Journal title
Solid State Communications
Serial Year
2010
Journal title
Solid State Communications
Record number
1766846
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