Title of article :
Structure-independent universality of Barkhausen criticality in iron nitride thin films
Author/Authors :
Atiq، نويسنده , , Shahid S. Siddiqi، نويسنده , , Saadat Anwar and Lee، نويسنده , , Hun-Sung and Anwar، نويسنده , , M. Sabieh and Shin، نويسنده , , Sung-Chul، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
4
From page :
1169
To page :
1172
Abstract :
Discrete and jerky jumps during the process of magnetization reversal in ferromagnetic systems cause Barkhausen intermittency. We have investigated critical scaling behavior of the Barkhausen avalanche of 2-dimensional γ-Fe4N thin films using a magneto-optic microscope magnetometer (MOMM) capable of time-resolved magnetic domain images. A statistical analysis of the fluctuating size of Barkhausen jumps from numerous repetitive experiments shows a power-law scaling behavior in the ferromagnetic iron nitride system exhibiting a critical exponent value of τ = 1.02 within the experimental error. The value of critical exponent is found to manifest universality irrespective of the degree of texture of the film induced by annealing temperature.
Keywords :
B. Epitaxy , A. Thin films
Journal title :
Solid State Communications
Serial Year :
2010
Journal title :
Solid State Communications
Record number :
1766878
Link To Document :
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