• Title of article

    Effects of characteristic x rays on the noise power spectra and detective quantum efficiency of photoconductive x-ray detectors

  • Author/Authors

    Rowlands، J. A. نويسنده , , Zhao، Wei 1972- نويسنده Shandong University, Weihai, China , , Ji، W. G. نويسنده ,

  • Issue Information
    دوفصلنامه با شماره پیاپی سال 2014
  • Pages
    -2038
  • From page
    2039
  • To page
    0
  • Abstract
    The effects of K fluorescence on the imaging performance of photoconductor-based xray imaging systems are investigated. A cascaded linear systems model was developed, where a parallel cascaded process was implemented to take into account the effect of Kfluorescence reabsorption on the modulation transfer function (MTF), noise power spectrum (NPS), and the spatial frequency dependent detective quantum efficiency [DQE(f)] of an imaging system. The investigation was focused on amorphous selenium (a-Se), which is the most highly developed photoconductor material for x-ray imaging. The results were compared to those obtained with Monte Carlo simulation using the same imaging condition and detector parameters, so that the validity of the cascaded linear system model could be confirmed. Our results revealed that K-fluorescence reabsorption in a-Se is responsible for a 18% drop in NPS at high spatial frequencies with an incident x-ray photon energy of E=20 keV (which is just above the K edge of 12.5 keV). When E increases to 60 keV, the effects of K-fluorescence reabsorption on NPS decrease to ~12% at high spatial frequencies. Because the high frequency drop is present in both MTF and NPS, the effect of K fluorescence on DQE(f) is minimal, especially for E that is much higher than the K edge. We also applied the cascaded linear system model to a newly developed compound photoconductor, lead iodide (PbI2), and found that at 60 keV there is a high frequency drop in NPS of 19%. The calculated NPS were compared to previously published measurements of PbI2 detectors.
  • Keywords
    Fault current limiter , short circuit current , transient over voltage , power quality
  • Journal title
    MEDICAL PHYSICS
  • Serial Year
    2001
  • Journal title
    MEDICAL PHYSICS
  • Record number

    1768