Title of article
Point defects in Langmuir–Blodgett films of Cd arachidate
Author/Authors
K. Nechev، نويسنده , , George and Hibino، نويسنده , , Masahiro and Hatta، نويسنده , , Ichiro، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
1
To page
6
Abstract
True molecular resolution with the atomic force microscope (AFM) has been achieved, on Langmuir–Blodgett multilayers, using films of cadmium arachidate on mica. The images were obtained with 12 μm scanner head and commercially purchased cantilevers with spring constant k=0.06 N m−1 under ambient conditions. The presence of vacancies in the Langmuir–Blodgett film was shown for the first time and is the evidence that AFM is a true probe for imaging molecular structure of soft organic materials. Well-preserved raw image of an isolated dislocation was resolved in this film clearly. The probability for existence of vacancies and free dislocations is discussed in the light of KTHNY theory.
Keywords
Two-dimensional solids , atomic force microscopy , Langmuir–Blodgett films , Defects , lattice structure
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Serial Year
2000
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Record number
1768051
Link To Document