Temperature evolution of anisotropic stress induced highly ordered stripe magnetic domains in thin film on (110) substrate

Highly ordered ferromagnetic (FM) domain patterns with out-of-plane magnetization have been observed in La0.7Sr0.3MnO3 (LSMO) thin film on (110) NdGaO3 (NGO). Crystal structure and strain state analyses show that this remarkable domain pattern originates from the in-plane anisotropic stress induced by the substrate. Magnetic force microscope (MFM) images at different temperatures show that the FM domain contrast gradually decreases upon heating and disappears around the transition temperature. The root mean square (RMS) of the MFM images coincides with the resistivity measurement, suggesting that the change in resistivity with temperature is mainly due to carrier scattering by thermal spin fluctuation.