Title of article :
EPR parameter factors and defect structures for ions in semiconductor
Author/Authors :
Zhang، نويسنده , , Shun-Ru and Zhu، نويسنده , , Shi-Fu and Zhao، نويسنده , , Bei-Jun، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
3
From page :
2194
To page :
2196
Abstract :
By using high-order perturbation formulas based on the two-spin–orbit (two-SO) coupling parameter mechanism and the superposition model, the g factors g and g ⊥ are calculated for Ni + ions (3d9) in a tetragonal tetrahedral crystal. By comparing the theoretical predictions with the g i values measured by electron paramagnetic resonance (EPR), the defect structures described by the anion position parameter μ , the angle θ and the tilting angle τ are estimated for the Ni + centers in CuGaSe 2 . The results indicate that the g factors of Ni + centers can be reasonably explained on the basis of the defect model.
Keywords :
A. Semiconductor , C. Point defects , D. Crystal and ligand fields , E. Electron paramagnetic resonance
Journal title :
Solid State Communications
Serial Year :
2010
Journal title :
Solid State Communications
Record number :
1768289
Link To Document :
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