• Title of article

    Two-sided empirical Bayes test for truncation parameter using NA samples

  • Author/Authors

    Yimin Shi، نويسنده , , Xiaolin Shi، نويسنده , , Jie Yan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    10
  • From page
    65
  • To page
    74
  • Keywords
    The truncated distribution family , Asymptotic optimality , Empirical Bayes test , Negatively associated samples , convergence rate
  • Journal title
    Information Sciences
  • Serial Year
    2005
  • Journal title
    Information Sciences
  • Record number

    176832

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=176832