• Title of article

    Bideposited thin-film retardation plates for use at deep UV wavelengths

  • Author/Authors

    Hodgkinson، نويسنده , , Ian and Hong Wu، نويسنده , , Qi and Arnold، نويسنده , , Matthew and De Silva، نويسنده , , Lakshman and Blaikie، نويسنده , , Richard، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2004
  • Pages
    2
  • From page
    106
  • To page
    107
  • Abstract
    The physical vapour deposition process of serial bideposition is used to fabricate inorganic retardation plates of LaF3, NdF3, Sc2O3 and SmF3. For a deposition angle of 70° the form-birefringent materials exhibit linear birefringence in the range 0.09–0.13 at wavelength 248 nm. The study shows that NdF3 and Sc2O3 are unsuitable for use at 193 nm, due to excessive absorptive loss, and that LaF3 is the preferred material.
  • Keywords
    Birefringence , Thin film , Polarizing phase shift mask , Retardation plate , Form birefringence
  • Journal title
    Current Applied Physics
  • Serial Year
    2004
  • Journal title
    Current Applied Physics
  • Record number

    1768408