Title of article
Bideposited thin-film retardation plates for use at deep UV wavelengths
Author/Authors
Hodgkinson، نويسنده , , Ian and Hong Wu، نويسنده , , Qi and Arnold، نويسنده , , Matthew and De Silva، نويسنده , , Lakshman and Blaikie، نويسنده , , Richard، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2004
Pages
2
From page
106
To page
107
Abstract
The physical vapour deposition process of serial bideposition is used to fabricate inorganic retardation plates of LaF3, NdF3, Sc2O3 and SmF3. For a deposition angle of 70° the form-birefringent materials exhibit linear birefringence in the range 0.09–0.13 at wavelength 248 nm. The study shows that NdF3 and Sc2O3 are unsuitable for use at 193 nm, due to excessive absorptive loss, and that LaF3 is the preferred material.
Keywords
Birefringence , Thin film , Polarizing phase shift mask , Retardation plate , Form birefringence
Journal title
Current Applied Physics
Serial Year
2004
Journal title
Current Applied Physics
Record number
1768408
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