Title of article :
Bideposited thin-film retardation plates for use at deep UV wavelengths
Author/Authors :
Hodgkinson، نويسنده , , Ian and Hong Wu، نويسنده , , Qi and Arnold، نويسنده , , Matthew and De Silva، نويسنده , , Lakshman and Blaikie، نويسنده , , Richard، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2004
Pages :
2
From page :
106
To page :
107
Abstract :
The physical vapour deposition process of serial bideposition is used to fabricate inorganic retardation plates of LaF3, NdF3, Sc2O3 and SmF3. For a deposition angle of 70° the form-birefringent materials exhibit linear birefringence in the range 0.09–0.13 at wavelength 248 nm. The study shows that NdF3 and Sc2O3 are unsuitable for use at 193 nm, due to excessive absorptive loss, and that LaF3 is the preferred material.
Keywords :
Birefringence , Thin film , Polarizing phase shift mask , Retardation plate , Form birefringence
Journal title :
Current Applied Physics
Serial Year :
2004
Journal title :
Current Applied Physics
Record number :
1768408
Link To Document :
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