Title of article :
Critical thickness of quantum well for observing Franz–Keldysh oscillation
Author/Authors :
Chen، نويسنده , , R.B and Lu، نويسنده , , Yan-Ten، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
4
From page :
117
To page :
120
Abstract :
Using scaling Fourier transformation (FT), we study the electro-reflectance spectra of quantum wells (QW) with well thickness from 200 to 1500 Å under a built-in electric field 50 kV/cm. For wider QWs, the FT of the spectra with energy scaled in (ℏω−Eg)3/2 exhibits Franz–Keldysh oscillation characteristic peaks. On the contrary, for the narrower QWs the characteristic peak of quantum confinement can be observed in FT with energy scaled in ℏω−Eg. By comparing the Fourier spectra, we set the transition width at 600 Å, which is much larger and more realistic than those reported previously.
Keywords :
D. Optical properties , A. Semiconductors
Journal title :
Solid State Communications
Serial Year :
2000
Journal title :
Solid State Communications
Record number :
1769156
Link To Document :
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