Author/Authors :
Dharmadhikari، نويسنده , , C.V and Ali، نويسنده , , A.O and Suresh، نويسنده , , N and Phase، نويسنده , , D.M and Chaudhari، نويسنده , , S.M and Ganesan، نويسنده , , V and Gupta، نويسنده , , A and Dasannacharya، نويسنده , , B.A، نويسنده ,
Abstract :
The roughness and general morphology of platinum films grown on Si(100) substrates have been investigated using X-ray Scattering, Scanning Tunneling Microscopy and Atomic Force Microscopy. The results are quantitatively analyzed in terms of height histograms and height–height correlations in the light of dynamical scaling approach. The values of roughness exponent α≅0.7, growth exponent β≅0.52 and dynamical scaling exponent z≅1.4 are in agreement with improvised KPZ exponents based on Kolmogorovʹs energy cascade concept.
