Author/Authors :
Makino، نويسنده , , H. and Kim، نويسنده , , J.J. and Nakamura، نويسنده , , T. and Muro، نويسنده , , T. and Kobayashi، نويسنده , , K. and Yao، نويسنده , , T.، نويسنده ,
Abstract :
Soft X-ray magnetic circular dichroism (XMCD) have been measured for the Ga0.97Cr0.03N film grown by NH3-assisted molecular beam epitaxy. Temperature dependence of the XMCD intensity was well described by the Curie–Weiss law. Although the sample showed ferromagnetic behavior at least up to room temperature, the ferromagnetic component could not be detected by the XMCD measurement.
Keywords :
Ferromagnetism , X-ray magnetic circular dichroism , Gallium nitride , Chromium
