Title of article :
Cross-platform characterization of electron tunneling in molecular self-assembled monolayers
Author/Authors :
Lee، نويسنده , , Takhee and Wang، نويسنده , , Wenyong and Zhang، نويسنده , , J.J. and Su، نويسنده , , J. and Klemic، نويسنده , , J.F. and Reed، نويسنده , , M.A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2005
Pages :
5
From page :
213
To page :
217
Abstract :
Electron tunneling is investigated for the alkanethiol self-assembled monolayers (SAMs) formed using three different device structures spanning from the nanometer to the micrometer scale. The measured current–voltage characteristics for the alkanethiol SAMs can be explained by the classical metal–insulator–metal tunneling model and the tunneling current exhibits overall exponential trend on the molecular length. Although different structures give consistent results (such as decay coefficient), unambiguous determination of the tunneling requires characterization of length and temperature dependencies.
Keywords :
Self-assembled monolayer , Alkanethiol , Tunneling , molecular electronics
Journal title :
Current Applied Physics
Serial Year :
2005
Journal title :
Current Applied Physics
Record number :
1769788
Link To Document :
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