Title of article
Simultaneous measurement on particles in solution with size ranging from nm to sub-mm by microscope light scattering spectroscopy and image analyzing system
Author/Authors
Huang، نويسنده , , Yao-Xiong، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2005
Pages
4
From page
549
To page
552
Abstract
A novel microscope light scattering spectroscopy and image analyzing system has been developed for simultaneous measurements on particle size distribution in solutions with size ranging from nanometer to sub-millimeter, and for surface porosity analysis on solid materials. The present paper introduces the technique of this system and its applications to various materials.
Keywords
Microscope light scattering spectroscopy , Nano-particle , Size distribution , surface porosity
Journal title
Current Applied Physics
Serial Year
2005
Journal title
Current Applied Physics
Record number
1769967
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