Title of article
Studies on thin films of lead chalcogenides
Author/Authors
Kumar، نويسنده , , Sushil and Khan، نويسنده , , Zishan H. and Majeed Khan، نويسنده , , M.A. and Husain، نويسنده , , M.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2005
Pages
6
From page
561
To page
566
Abstract
A good deal of information regarding the synthesis and opto–electro-structural properties of thin films of lead chalcogenides have been revealed. The development of laser technology had opened up new application for narrow gap lead salts and their alloys. The polycrystalline thin films were deposited onto optically plane and chemically clean glass substrates by vacuum evaporation technique. The films were thin, uniform, smooth and tightly adherent to the substrates.Optical absorption spectroscopy, X-ray diffraction technique and current–voltage characteristics method were used to characterize the films. The absorption coefficients and optical band gaps of films were determined by using FTIR spectrophotometer. The nature of sample, crystal structure and lattice parameters of films were found from X-ray diffractograms. The dc conductivities and activation energies of films were measured in temperature range 300–380 K. Schottky junctions of PbS, PbSe and PbTe with indium metal were made. The barrier heights and ideality factors of these metal–semiconductor junctions were determined by using I–V characteristics.
Keywords
Band gap , optical absorption , DC conductivity , Lead chalcogenides , barrier height
Journal title
Current Applied Physics
Serial Year
2005
Journal title
Current Applied Physics
Record number
1769973
Link To Document