Structural characterization of monolayer and regularly stacked multi-layers composed of silver nanoparticles by using X-ray reflectivity

Layer structures of monolayer and multilayers composed of passivated silver (Ag) nanoparticles are analyzed using X-ray reflectivity (XR) measurements. In the XR profile of the monolayer, the “Kiessig fringe” is observed above the critical angle. A simple layer model is suitable for the nanoparticle layer structure in the low-angle region. A distinct quasi-Bragg reflection (QBR) due to the periodical layer structure appears in the XR profile of multilayers. The estimated periodic distance between the layers is larger than that of a three-dimensional closed packing model, while these particles pack hexagonally in the layer.