Title of article
Structural characterization of monolayer and regularly stacked multi-layers composed of silver nanoparticles by using X-ray reflectivity
Author/Authors
Kuwajima، نويسنده , , Shuichiro and Okada، نويسنده , , Yuji and Yoshida، نويسنده , , Yuji and Abe، نويسنده , , Koji and Tanigaki، نويسنده , , Nobutaka and Yamaguchi، نويسنده , , Tomohiko and Nagasawa، نويسنده , , Hiroshi and Sakurai، نويسنده , , Kenji and Yase، نويسنده , , Kiyoshi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
1
To page
5
Abstract
Layer structures of monolayer and multilayers composed of passivated silver (Ag) nanoparticles are analyzed using X-ray reflectivity (XR) measurements. In the XR profile of the monolayer, the “Kiessig fringe” is observed above the critical angle. A simple layer model is suitable for the nanoparticle layer structure in the low-angle region. A distinct quasi-Bragg reflection (QBR) due to the periodical layer structure appears in the XR profile of multilayers. The estimated periodic distance between the layers is larger than that of a three-dimensional closed packing model, while these particles pack hexagonally in the layer.
Keywords
Closed pack , Nanoparticle , Multilayer , X-ray reflectivity , Monolayer , Layer structure
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Serial Year
2002
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Record number
1770270
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