Author/Authors :
Kim، نويسنده , , Byung-Hoon and Jeon، نويسنده , , Young-Sun and Jeong، نويسنده , , Ju-Hyung and An، نويسنده , , Jun-Hyung and Jeon، نويسنده , , Kyung-Ok and Hwang، نويسنده , , Kyu-Seog، نويسنده ,
Abstract :
Highly transparent titanium oxide thin films were prepared on soda-lime–silica slide glass substrates from a titanium naphthenate precursor. Films prefired at 500 °C for 10 min were finally heat treated at 500 °C for 30 min in air. Crystallinity of the films was analyzed by high resolution X-ray diffraction analysis. A sharp absorption edge of the TiO2 film was observed. The estimated energy band gap for the film is larger than that of single crystal TiO2.
