Author/Authors :
Xu، نويسنده , , Can and Wang، نويسنده , , Liwei and Qian، نويسنده , , Shixiong and Zhao، نويسنده , , Li and Wang، نويسنده , , Zichen and Li، نويسنده , , Yufen، نويسنده ,
Abstract :
The clustering dynamics of SiO2-containing negative ion clusters generated from ultrafine amorphous SiO2 powders with high specific surface area is investigated by XeCl excimer laser ablation time-of-flight mass spectrometry (TOF-MS). From the evolution of the mass spectra with the delay time and the number of laser irradiation shots, the key roles played by OH and OH− fragments from the surface silanol groups in the formation of SiO2-containing negative ion clusters are discussed.
