Title of article
Monolayer X-ray reflectometry at the air–water interface
Author/Authors
Yamaoka، نويسنده , , Hitoshi and Matsuoka، نويسنده , , Hideki and Kago، نويسنده , , Keitaro and Endo، نويسنده , , Hitoshi and Eckelt، نويسنده , , John and Yoshitome، نويسنده , , Ryuji، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
4
From page
245
To page
248
Abstract
X-ray reflectometry (XR) of the air–liquid interface has been restricted because of instrumental limitations. We have newly constructed a high-performance XR apparatus which can accommodate a Langmuir–Blodgett trough for air–water interface study. Since this apparatus has a large dynamic range, XR measurements can be performed for monolayers on a water surface at controlled surface pressure. The XR profiles for the lipids distearoylphosphatidylcholine (DSPC) and dibehenoylphosphatidylcholine showed clear Kiessig fringes. The total thickness of the DSPC monolayer changed from 25.5 to 27.1 Å with increasing surface pressure from 10 to 40 mN/m. A systematic XR study for monolayers on water surfaces is possible with this instrument.
Journal title
Chemical Physics Letters
Serial Year
1998
Journal title
Chemical Physics Letters
Record number
1775485
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