Title of article :
The formation of etch hillocks during step-flow etching of Si(111)
Author/Authors :
Flidr، نويسنده , , Jaroslav and Huang، نويسنده , , Yi-Chiau and Newton، نويسنده , , Theresa A. and Hines، نويسنده , , Melissa A.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
6
From page :
85
To page :
90
Abstract :
The formation of etch hillocks during NH4F etching of vicinal Si(111) surfaces was investigated by scanning tunneling microscopy and kinetic Monte Carlo simulations. Simple, site-specific reaction kinetics are shown to produce two- and three-dimensional etch hillocks. Two-dimensional hillocks are nucleated at self-propagating defect sites. Their size is kinetically controlled. Simulations showed that three-dimensional hillocks can be caused by the collisions of two-dimensional hillocks.
Journal title :
Chemical Physics Letters
Serial Year :
1999
Journal title :
Chemical Physics Letters
Record number :
1777177
Link To Document :
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