Title of article :
Photoelectron spectromicroscopy of electrochemically induced oxygen spillover at the Pt/YSZ interface
Author/Authors :
Luerكen، نويسنده , , B. and Günther، نويسنده , , S. and Marbach، نويسنده , , H. and Kiskinova، نويسنده , , M. and Janek، نويسنده , , J. and Imbihl، نويسنده , , R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
5
From page :
331
To page :
335
Abstract :
Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 إ thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.
Journal title :
Chemical Physics Letters
Serial Year :
2000
Journal title :
Chemical Physics Letters
Record number :
1780785
Link To Document :
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