Title of article :
Direct growth of amorphous silica nanowires by solid state transformation of SiO2 films
Author/Authors :
Lee، نويسنده , , Kihong and Yang، نويسنده , , Hyuck Soo and Baik، نويسنده , , Kwang Hyeon and Bang، نويسنده , , Jungsik and Vanfleet، نويسنده , , Richard R. and Sigmund، نويسنده , , Wolfgang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
5
From page :
380
To page :
384
Abstract :
Amorphous silica nanowires (a-SiONWs) were produced by direct solid state transformation from silica films. The silica nanowires grow on TiN/Ni/SiO2/Si substrates during the annealing in H2 or a H2:CH4 mixture at 1050 °C. Titanium nitride (TiN) films were used to induce a solid state reaction with silica (SiO2) films on silicon wafers to provide silicon atoms into growing nanowires. The TiN layers induce the diffusion of silicon and oxygen to the surface by a stress gradient built inside the films. The nickel diffuses to the surface during the TiN deposition and acts as a nucleation site for the a-SiONWs.
Journal title :
Chemical Physics Letters
Serial Year :
2004
Journal title :
Chemical Physics Letters
Record number :
1784937
Link To Document :
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