Title of article
Cavity ring-down spectroscopy measurements of the concentrations of C2(X1Σg+) radicals in a DC arc jet reactor used for chemical vapour deposition of diamond films
Author/Authors
S.L. and Rennick، نويسنده , , C.J. and Smith، نويسنده , , J.A. and Ashfold، نويسنده , , M.N.R. and Orr-Ewing، نويسنده , , A.J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
518
To page
522
Abstract
Absorption spectroscopy measurements are reported of the absolute number density (3.0 ± 0.9 × 1012 cm−3) and vibrational temperature (3000 ± 500 K) of C2(X1Σg+) radicals in a DC arc activated chemical vapour deposition reactor under the standard operating conditions (3.3% CH4 in H2 and 6.4 kW discharge) used to grow polycrystalline diamond films. The ratio of number densities of C2 radicals in their ground (X1Σg+) and low-lying electronically excited (a3Πu) states is close to that expected from a Boltzmann distribution at the measured temperature, despite the more rapid rates of reaction of C2(X) with H2 and hydrocarbon molecules.
Journal title
Chemical Physics Letters
Serial Year
2004
Journal title
Chemical Physics Letters
Record number
1785014
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