• Title of article

    Modelling of thermally detected optical absorption and luminescence of (In,Ga)N/GaN heterostructures

  • Author/Authors

    Siozade، نويسنده , , L and Leymarie، نويسنده , , J and Disseix، نويسنده , , P and Vasson، نويسنده , , A and Mihailovic، نويسنده , , M and Grandjean، نويسنده , , N and Leroux، نويسنده , , M and Massies، نويسنده , , J، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    5
  • From page
    575
  • To page
    579
  • Abstract
    Thermally detected optical absorption (TDOA) and photoluminescence (PL) experiments are performed at 0.35 and 4 K, respectively, on InxGa1−xN (x≤0.12) layers grown on GaN by molecular beam epitaxy. The modelling of absorption allows us to extract the absorption coefficients and bandgap energies of (In,Ga)N alloy. A bowing parameter equal to 2.4 eV is deduced. The knowledge of the GaN complex refractive index, previously measured, enables us to account for the Fabry–Perot interferences which structure the TDOA and PL spectra. A procedure is proposed to remove the latter in the PL spectrum of nitride based heterostructures. The model is based on the description of the light propagation in an active layer sandwiched between two heterostructures. The parameters deduced from the absorption line shape adjustment are used to take the absorption and optical path into account in the different layers of the samples.
  • Keywords
    A. Thin films , A. Semiconductors , D. Optical properties , E. Light absorption and reflection , E. Luminescence
  • Journal title
    Solid State Communications
  • Serial Year
    2000
  • Journal title
    Solid State Communications
  • Record number

    1785867